Metrology X-Ray Diffraction
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Rigaku SmartLab XRD

Multipurpose X-ray diffractometer for powder, thin film, and nanostructure analysis. Supports phase ID, texture, stress measurements, reciprocal space mapping, and reflectivity.

Reserve Tool View Specs
Rigaku SmartLab XRD
X-Ray Source Cu tube (up to 40 kV/44 mA)
Detector HyPix-3000 (0D/1D/2D)
Goniometer ~0.0001 deg resolution
Optics Cross Beam Optics (CBO)

System Capabilities

The SmartLab is a high-resolution, multipurpose XRD platform with automated optics and detector modes to support powders, thin films, and nanostructured materials.

Cross Beam Optics (CBO) enables fast switching between focusing and parallel-beam geometries, while the HyPix-3000 detector supports 0D, 1D, and 2D data collection.

Operating Modes

Powder XRD (theta-2theta)

Standard phase identification and crystallinity assessment.

Grazing Incidence XRD

Near-surface diffraction for thin films and coatings.

X-Ray Reflectivity (XRR)

Film thickness, density, and interface roughness.

Texture / Pole Figures

Crystallographic orientation and stress analysis.

Technical Specifications

X-Ray Source Cu tube (sealed up to 40 kV/44 mA or rotating anode up to 9 kW)
Goniometer High-accuracy theta-theta geometry with ~0.0001 deg resolution
Detector HyPix-3000 semiconductor detector (0D/1D/2D)
Optics Cross Beam Optics (CBO) for focusing or parallel beam
Sample Types Powders, bulk solids, thin films, wafers, liquids/pastes with holders
Maximum Sample Size Up to about 6 in wafers (thin film stage dependent)
Software SmartLab Studio II for guided workflows and analysis

Comparison: Modern XRD vs. Debye-Scherrer Film Camera

Comparing the SmartLab system to traditional film-based powder cameras.

Feature This System (SmartLab) Traditional Method (Film Camera)
Detector Digital HyPix detector (0D/1D/2D) Photographic film
Data Collection Fast, automated scans Long exposure times on film
Data Handling Direct digital analysis and export Manual measurement from film
Geometry Options Multiple scan modes and optics Fixed powder camera geometry
Best Use High-throughput research and thin film studies Basic powder diffraction demonstrations

Common Applications

Phase Identification Powder diffraction and crystallinity analysis.
Thin Film Characterization GIXRD, HRXRD, and reciprocal space mapping.
Texture and Stress Pole figures, rocking curves, and residual stress.
X-Ray Reflectivity Film thickness, density, and interface roughness.