Lyncee Tec DHM-R2100 Optical Holographic Profiler
A reflection-mode digital holographic microscope for non-contact 3D surface profilometry. It provides interferometric vertical resolution for real-time topography on reflective and partially reflective samples.
System Capabilities
The DHM-R2100 is a dual-wavelength reflection DHM designed for quantitative 3D surface measurements. It captures full-field holograms to reconstruct height maps without mechanical scanning.
The system supports real-time measurement of static and dynamic surface features and can resolve sharp steps and complex topography with nanometer-scale vertical precision.
Operating Modes
Single-Wavelength DHM
High-precision profiling for smooth surfaces and small steps.
Dual-Wavelength Mode
Extended step-height capability using synthetic wavelength processing.
Real-Time 3D Profilometry
Full-field 3D maps from a single hologram frame.
Numerical Refocusing
Digital refocus after capture to inspect different depths.
Technical Specifications
| Configuration | Reflection DHM, dual-wavelength |
|---|---|
| Typical Wavelengths | ~666 to 675 nm and ~794 nm |
| Vertical Accuracy | ~0.15 nm (single-wavelength mode) |
| Lateral Resolution | Objective-dependent, down to ~300 nm |
| Acquisition Rate | Up to ~190 fps at 1024 x 1024 |
| Minimum Reflectivity | Below 1 percent in reflection mode |
Comparison: This System vs Conventional Alternative
A high-level comparison to highlight performance and workflow advantages.
| Feature | This System | Conventional Method |
|---|---|---|
| Precision | Higher accuracy and repeatability | Standard tolerance |
| Workflow | Streamlined and automated | Manual or multi-step |
| Throughput | Faster turnaround | Slower cycle time |