Metrology Nanometrology

B-2 Atomic Force Microscope (AFM)

A versatile AFM platform for high-resolution 3D surface imaging. The B-2 supports nanoscale topography measurement with precision scanning for research and teaching applications.

Reserve Tool View Specs
B-2 AFM System
XY Scan Range 50 um
Z Range 17 um
Resolution < 0.1 nm
Noise Floor < 0.08 nm

System Capabilities

The B-2 AFM delivers nanoscale topography and surface characterization. It supports high-resolution imaging for materials, thin films, and nanostructures.

The system is well suited for both advanced research and instructional labs requiring reliable nanoscale surface measurement.

Operating Modes

Contact Mode

Direct surface tracking for robust topography imaging.

Tapping Mode

Intermittent contact imaging for delicate samples.

Roughness Analysis

Quantitative surface roughness measurements.

3D Topography

High-resolution 3D surface mapping.

Technical Specifications

XY Scan Range 50 um x 50 um
Z Range 17 um
Resolution < 0.1 nm
Noise Floor < 0.08 nm
Imaging High-resolution 3D surface topography
Platform AFM Workshop B-2 system

Comparison: This System vs Conventional Alternative

A high-level comparison to highlight performance and workflow advantages.

Feature This System Conventional Method
Precision Higher accuracy and repeatability Standard tolerance
Workflow Streamlined and automated Manual or multi-step
Throughput Faster turnaround Slower cycle time

Common Applications

Nanostructures Measure height and pitch of nanoscale features.
Thin Films Roughness and uniformity analysis of coatings.
Materials Research Surface morphology and texture studies.
Teaching Labs Hands-on nanoscale imaging instruction.